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Journal of Electrical Electronics Engineering(JEEE)

ISSN: 2834-4928 | DOI: 10.33140/JEEE

Impact Factor: 1.2

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Articles in Press

Journal DOI: 10.33140/JEEE

Volume 4, Issue 1 (2025)

Research Article

In-Situ Interferometric Metrology with Optical Comb

  • Hirokazu Matsumoto
DOI 10.33140/JEEE.04.01.02

Short Communication

Intrinsic Vacuum Space and the Problem of Hubble Constant

  • Yvan-Claude Raverdy
DOI 10.33140/JEEE.04.01.01