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Journal of Electrical Electronics Engineering(JEEE)

ISSN: 2834-4928 | DOI: 10.33140/JEEE

Impact Factor: 1.2

Robust Outdoor Positioning Via Ray Tracing

Citation

Vladislav Ryzhov

Ryzhov, V. (2023). Robust Outdoor Positioning via Ray Tracing. J Electrical Electron Eng, 2(2), 87-96.

Abstract PDF