Journal of Electrical Electronics Engineering(JEEE)
ISSN: 2834-4928 | DOI: 10.33140/JEEE
Impact Factor: 1.2
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Detection of False Data Injection Attacks in Smart-Grid Systems: Benchmarking Deep Learning Techniques
Citation
Lukumba Phiri*, Simon Tembo
Phiri L, Tembo S. (2023). Detection of False Data Injection Attacks in Smart-Grid Systems: Benchmarking Deep Learning Techniques. J Electrical Electron Eng, 2(1), 41-49.